Klarity Defect 3.3

Klarity Defect is an automated inline defect analysis and data management system designed to help semiconductor fabs identify yield issues quickly. It provides capabilities such as efficient defect source analysis, recipe creation, and integration with inspection and review tools.

Klarity Defect is an automated inline defect analysis module and data management system that helps fabs achieve faster yield learning cycles through real-time identification of excursions. Featuring easy recipe creation and seamless integration with inspectors and review tools, Klarity Defect is a yield acceleration strategy that provides capabilities such as efficient defect source analysis, to accelerate the identification of yield problems.